TEOS, Si(OC2H5)4, TetraEthyl OrthoSilicate, CAS# 78-10-4

Plasma Enhanced Atomic Layer Deposition Film Publications

Your search for publications using this chemistry returned 7 record(s).

NumberTitle
1Electrical Properties of Aluminum Silicate Films Grown by Plasma Enhanced Atomic Layer Deposition
2Characteristics of Hf-silicate thin films synthesized by plasma enhanced atomic layer deposition
3Optical and Electrical Properties of TixSi1-xOy Films
4Characteristics of Hf-silicate thin films synthesized by plasma enhanced atomic layer deposition
5Radical Enhanced Atomic Layer Deposition of Metals and Oxides
6Nanometer-Thick Conformal Pore Sealing of Self-Assembled Mesoporous Silica by Plasma-Assisted Atomic Layer Deposition
7Characteristics of Aluminum Silicate Films Grown by Plasma-Enhanced Atomic Layer Deposition

© 2014-2026 plasma-ald.com