About Plasma ALD, LLC

The Plasma Enhanced Atomic Layer Deposition Publication Database is developed and maintained by Plasma ALD, LLC, a developer and supplier of inductively coupled plasma (ICP) sources for plasma-enhanced atomic layer deposition (PEALD), atomic layer etch (ALE), thin-film etching, surface cleaning, surface modification, and research plasma systems.

Our ICP sources are designed for integration with existing ALD and vacuum-processing equipment. Plasma ALD also provides plasma-source integration, process-development, and troubleshooting assistance based on decades of experience with low-pressure plasma processing and PEALD systems.

Researchers, universities, equipment manufacturers, and laboratories looking for an ICP plasma source or assistance adding plasma capability to a vacuum system can learn more on our Plasma Sources page.

Low temperature plasma-enhanced ALD enables cost-effective spacer defined double patterning (SDDP)

Type:
Journal
Info:
Proc. SPIE 7520, Lithography Asia 2009
Date:
2009-12-09

Author Information

Name Institution
Julien BeynetASM Microchemistry Oy
Patrick WongIMEC
Andy MillerIMEC
Sabrina LocorotondoIMEC
Diziana VangoidsenhovenIMEC
Tae-Ho YoonASM Microchemistry Oy
Marc DemandIMEC
Hyung-Sang ParkASM Microchemistry Oy
Tom VandeweyerIMEC
Hessel SpreyASM Microchemistry Oy
Yong-Min YooASM Microchemistry Oy
Mireille MaenhoudtIMEC

Films

Plasma SiO2

Hardware used: Unknown


Film/Plasma Properties

Characteristic: Thickness
Analysis: Ellipsometry

Characteristic: Images
Analysis: SEM, Scanning Electron Microscopy

Substrates

Photoresist

Notes

747