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Steady-state Thermal Conductivity Measurement of Dielectric Stacks for Phase-Change Memory Power Reduction
Type:
Other
Info:
HP Laboratories Technical Report
Date:
2015-07-21
Author Information
| Name | Institution |
|---|---|
| Scott W. Fong | Hewlett-Packard |
| Gary A. Gibson | Hewlett-Packard |
| Liang Chen | Hewlett-Packard |
| Aditya Sood | Hewlett-Packard |
| Mehdi Asheghi | Hewlett-Packard |
| Niru Kumari | Hewlett-Packard |
| H.-S. P. Wong | Hewlett-Packard |
Films
Film/Plasma Properties
Substrates
| Silicon |
Notes
| 384 |