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Bipolar resistive switching in amorphous titanium oxide thin film
Type:
Journal
Info:
physica status solidi (RRL) - Rapid Research Letters Volume 4, Issue 1-2, pages 28--30, 2010
Date:
2009-11-23
Author Information
| Name | Institution |
|---|---|
| Hu Young Jeong | Korea Advanced Institute of Science and Technology |
| Jeong Yong Lee | Korea Advanced Institute of Science and Technology |
| Min-Ki Ryu | Electronics and Telecommunication Research Institute, (ETRI) |
| Sung-Yool Choi | Electronics and Telecommunication Research Institute, (ETRI) |
Films
Film/Plasma Properties
Characteristic: Resistive Switching
Analysis: I-V, Current-Voltage Measurements
Characteristic: Images
Analysis: TEM, Transmission Electron Microscope
Substrates
| Al |
Notes
| Available on archive.org at https://arxiv.org/pdf/0908.3525.pdf |
| 738 |