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Effective Surface Passivation of InP Nanowires by Atomic-Layer-Deposited Al2O3 with POx Interlayer
Type:
Journal
Info:
Nano Lett., 2017, 17 (10), pp 6287-6294
Date:
2017-09-05
Author Information
| Name | Institution |
|---|---|
| Lachlan E. Black | Eindhoven University of Technology |
| A. Cavalli | Eindhoven University of Technology |
| Marcel A. Verheijen | Eindhoven University of Technology |
| J. E. M. Haverkort | Eindhoven University of Technology |
| E. P. A. M. Bakkers | Eindhoven University of Technology |
| Erwin (W.M.M.) Kessels | Eindhoven University of Technology |
Films
Plasma POx
Plasma Al2O3
Film/Plasma Properties
Characteristic: Thickness
Analysis: Ellipsometry
Characteristic: Images
Analysis: TEM, Transmission Electron Microscope
Characteristic: Chemical Composition, Impurities
Analysis: XPS, X-ray Photoelectron Spectroscopy
Characteristic: Bonding States
Analysis: XPS, X-ray Photoelectron Spectroscopy
Characteristic: Photoluminescence
Analysis: PL, PhotoLuminescence
Characteristic: IQE, Internal Quantum Efficiency
Analysis: PL, PhotoLuminescence
Substrates
| InP |
| POx |
Notes
| 1059 |