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Electrical characterization and reliability analysis of Al2O3/AlGaN/GaN MISH structure
Type:
Conference Proceedings
Info:
2014 IEEE International Reliability Physics Symposium, CD.6.1 - CD.6.5
Date:
2014-06-01
Author Information
| Name | Institution |
|---|---|
| Jiechen Wu | University of California - Los Angeles (UCLA) |
Films
Film/Plasma Properties
Characteristic: Unknown
Analysis: C-V, Capacitance-Voltage Measurements
Characteristic: Unknown
Analysis: I-V, Current-Voltage Measurements
Characteristic: Breakdown Voltage
Analysis: I-V, Current-Voltage Measurements
Substrates
Notes
| 249 |