Publication Information

Title: Comparison of the Low-Frequency Noise of Bulk Triple-Gate FinFETs With and Without Dynamic Threshold Operation

Type: Journal

Info: IEEE ELECTRON DEVICE LETTERS, VOL. 32, NO. 11, PP. 1597-1599, 2011

Date: 2011-09-26

DOI: http://dx.doi.org/10.1109/LED.2011.2166372

Author Information

Name

Institution

University of Sao Paulo

University of Sao Paulo

IMEC

IMEC

Films

Plasma TiN using Unknown

Deposition Temperature Range N/A

Film/Plasma Properties

Characteristic

Analysis

Diagnostic

Substrates

Keywords

Notes

637

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